IEC 60947-1-2007 低压开关装置和控制装置.第1部分:一般规则

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【英文标准名称】:Low-voltageswitchgearandcontrolgear-Part1:Generalrules
【原文标准名称】:低压开关装置和控制装置.第1部分:一般规则
【标准号】:IEC60947-1-2007
【标准状态】:现行
【国别】:国际
【发布日期】:2007-06
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/SC17B
【标准类型】:()
【标准水平】:()
【中文主题词】:使用种类;特性;分类;分类系统;结构要求;控制装置;控制设备;定义;电控制设备;电气工程;电气设备;电磁兼容性;EMC;检验;低电压;低压设备;低压开关装置;作标记;安装;使用条件;设备;产品信息;合格试验;额定值;规范(验收);开关装置;测试;测试条件;运输;定型测试
【英文主题词】:Accidentprevention;Accidents;Activities;Alternatingvoltages;Ambienttemperature;Atmosphere;Auxiliarycircuits;Auxiliarygenerator;Behaviour;Bodies;Breakingcapacity;Bushes(mechanicalcomponents);Categoriesofuse;Characteristics;Circuitdiagrams;Circuit-breakercomponents;Circuit-breakers;Circuits;Clamps;Classification;Classificationsystems;Clearances;Compatibility;Compressedair;Connections;Constructionrequirements;Constructions;Contact;Contamination;Continuouscurrent;Continuousoperation;Control;Controldevices;Controlequipment;Controlsystems;Controltechnology;Copperconductors;Currents;Definitions;Degreesofprotection;Design;Determinations;Directvoltage;Discharge;Earthconductors;Ecology;Electriccontrolequipment;Electricshock;Electricshocks;Electrical;Electricalaccidents;Electricalengineering;Electricalequipment;Electricalinsulation;Electricalsafety;Electrically-operateddevices;Electromagnetic;Electromagneticcompatibility;Electromagnets;EMC;Enclosures;Environment;Environmentalcondition;Environmentalconditions;Exponents;Fire;Flammability;Generalsection;Heat;Heating;Heightabovesealevel;Humidity;Humiditystress;Ignition;Impedance;Impurity;Indications;Inspection;Instruments;Insulationvoltage;Insulations;Interferencerejections;Intermittendduty;IPcode;Lay;Layout;Leakagepaths;Lifecycles;Life(durability);Limitdeviations;Loading;Lowvoltage;Low-voltageequipment;Low-voltageswitchgear;Marking;Materials;Mechanic;Mechanicaldrive;Monitors;Mounting;Operatingconditions;Operatingdevices;Operation;Overload;Overvoltage;Performance;Plant;Plug-and-socketconnection;Powerinstallations;Processautomation;Productinformation;Properties;Protection;Protectivemeasures;Qualificationtests;Ratedvoltages;Ratings;Relays;Ribs;Safety;Safetydevices;Safetyengineering;Safetymeasures;Safetyrequirements;Samples;Screens(protective);Separation;Servicevoltage;Shortcircuits;Specification(approval);Strengthofmaterials;Stress;Supply;Surgevoltagestrength;Switchgear;Temperature;Testing;Testingconditions;Thermal;Torque;Transport;Traps;Trippingmechanism;Typetesting;Vibration;Windings;Zeroconductors
【摘要】:Thisstandardapplies,whenrequiredbytherelevantproductstandard,toswitchgearandcontrolgearhereinafterreferredtoas"equipment"andintendedtobeconnectedtocircuits,theratedvoltageofwhichdoesnotexceed1000Va.c.or1500Vd.c.Itdoesnotapplytolow-voltageswitchgearandcontrolgearassemblieswhicharedealtwithinIEC60439.NOTEIncertainclausesorsubclausesofthisstandard,theequipmentcoveredbythisstandardisalsoreferredtoas"device",tobeconsistentwiththetextofsuchclausesorsubclauses.
【中国标准分类号】:K30
【国际标准分类号】:29_130_20
【页数】:453P;A4
【正文语种】:英语


【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Neutronirradiation
【原文标准名称】:半导体器件.机械和气候试验方法.中子辐照
【标准号】:BSEN60749-17-2003
【标准状态】:现行
【国别】:英国
【发布日期】:2003-06-19
【实施或试行日期】:2003-06-19
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:气候试验;电气工程;破坏试验;试验;半导体;集成电路;中子射线;气候;辐射效应;环境试验;半导体器件;电学测量;电子工程;机械试验;电子设备及元件;元部件
【英文主题词】:
【摘要】:Theneutronirradiationtestisperformedtodeterminethesusceptibilityofsemiconductordevicestodegradationintheneutronenvironment.Thetestsdescribedhereinareapplicabletointegratedcircuitsanddiscretesemiconductordevices.Thistestisintendedformilitary-andspace-relatedapplications.Itisadestructivetest.Theobjectivesofthetestareasfollows:a)todetectandmeasurethedegradationofcriticalsemiconductordeviceparametersasafunctionofneutronfluence,andb)todetermineifspecifiedsemiconductordeviceparametersarewithinspecifiedlimitsafterexposuretoaspecifiedlevelofneutronfluence(seeClause4).
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:10P;A4
【正文语种】:英语


MIL-STD-196E, MILITARY STANDARD: JOINT ELECTRONICS TYPE DESIGNATION SYSTEM (17 FEB 1998)., The purpose of this document is to standardize the preparation of Requests for Nomenclature and the assignment of type designations for electronic items under the Joint Electronics Type Designation System (JETDS).